Hardcover: 808 pages
Publisher: Morgan Kaufmann; 1 edition (June 13, 2008)
Language: English
ISBN-10: 0123741238
ISBN-13: 978-0123741233
Product Dimensions: 2 x 7.5 x 9.2 inches
Shipping Weight: 3.9 pounds (View shipping rates and policies)
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Best Sellers Rank: #2,778,490 in Books (See Top 100 in Books) #96 in Books > Computers & Technology > Hardware & DIY > Microprocessors & System Design > DSPs #303 in Books > Computers & Technology > Hardware & DIY > Microprocessors & System Design > Microprocessor Design #308 in Books > Computers & Technology > Hardware & DIY > Microprocessors & System Design > Embedded Systems
Embedded DSP Processor Design, : Application Specific Instruction Set Processors (Systems on Silicon) DSP Software Development Techniques for Embedded and Real-Time Systems (Embedded Technology) Modern Processor Design: Fundamentals of Superscalar Processors MODERN PROCESSOR DESIGN: Fundamentals of Superscalar Processors, Beta Edition Design of Softcore DSP Processors on FPGA Chips DSP Processor Fundamentals: Architectures and Features Embedded SoPC Design with Nios II Processor and Verilog Examples DSP for Embedded and Real-Time Systems DSP without math: A brief introduction to DSP The Art of DSP: An innovative introduction to DSP Design Patterns for Embedded Systems in C: An Embedded Software Engineering Toolkit Advanced Memory Optimization Techniques for Low-Power Embedded Processors Applied Control Theory for Embedded Systems (Embedded Technology) Analog Interfacing to Embedded Microprocessor Systems, Second Edition (Embedded Technology Series) Real-Time UML Workshop for Embedded Systems, Second Edition (Embedded Technology) Embedded Systems Architecture: A Comprehensive Guide for Engineers and Programmers (Embedded Technology) Embedded Image Processing on the TMS320C6000TM DSP: Examples in Code Composer StudioTM and MATLAB Timing Verification of Application-Specific Integrated Circuits (ASICs) Seed Purity and Taxonomy: Application of Purity Testing Techniques to Specific Taxonomical Groups of Seeds VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)